Counterfeit Combates with Miniaturized Authentication Imaging System

(EPFL, July 31, 2013)

In order to prevent counterfeit forgeries, EPFL researchers have proposed a new miniaturized authentication system. By using both moiré patterns and microlithography techniques, forgeries can be easily detected with the naked eye and impossible to recreate with an existing printer or scanner technology. Two EPFL research teams, led by professors Roger D. Hersch and Jürgen Brügger, have combined their respective specialties: the moiré pattern technique together with microlithography, a circuit manufacturing technique using engraving at a micrometer scale. The researchers obtained a dynamic and minuscule image that offers an interesting alternative to holograms. Despite their small size (about 0.5 × 0.5 cm), the patterns are easily recognizable with the naked eye. Consequently, an infrared microscope is not required to authenticate. In addition, this method offers the possibility of showing complex and high resolution images of nearly 10,000 dpi.